fix run_tests.h that was badly messed up
diff --git a/test/run_tests.h b/test/run_tests.h
index 013b6e5..093e246 100644
--- a/test/run_tests.h
+++ b/test/run_tests.h
@@ -27,127 +27,6 @@
(This is the MIT license)
==============================================================================*/
// Created by Laurence Lundblade on 9/30/18.
+typedef int (*outputstring)(const char *szString, void *ctx);
-
-#include "run_tests.h"
-#include "UsefulBuf.h"
-#include <stdbool.h>
-
-#include "half_precision_test.h"
-#include "basic_test.h"
-#include "bstrwrap_tests.h"
-
-// Used to test the test runner
-int fail_test()
-{
- return -44;
-}
-
-
-/*
- Convert a number up to 999999999 to a string. This is so sprintf doesn't
- have to be linked in so as to minimized dependencies even in test code.
-
- This function does pointer math. TODO: test this.
- */
-const char *NumToString(int32_t nNum, UsefulBuf StringMem)
-{
- const uint32_t uMax = 1000000000;
-
- UsefulOutBuf OutBuf;
- UsefulOutBuf_Init(&OutBuf, StringMem);
-
- if(nNum < 0) {
- UsefulOutBuf_AppendByte(&OutBuf, '-');
- nNum = -nNum;
- }
- if(nNum > uMax-1) {
- return "XXX";
- }
-
- bool bDidSomeOutput = false;
- for(int n = uMax; n > 0; n/=10) {
- int x = nNum/n;
- if(x || bDidSomeOutput){
- bDidSomeOutput = true;
- UsefulOutBuf_AppendByte(&OutBuf, '0' + x);
- nNum -= x * n;
- }
- }
- if(!bDidSomeOutput){
- UsefulOutBuf_AppendByte(&OutBuf, '0');
- }
- UsefulOutBuf_AppendByte(&OutBuf, '\0');
-
- return UsefulOutBuf_GetError(&OutBuf) ? "" : StringMem.ptr;
-}
-
-
-
-typedef int (test_fun_t)(void);
-
-#define TEST_ENTRY(test_name) {#test_name, test_name}
-typedef struct {
- const char *szTestName;
- test_fun_t *test_fun;
-} test_entry;
-
-test_entry s_tests[] = {
- TEST_ENTRY(basic_test_one),
- TEST_ENTRY(half_precision_encode_basic),
- TEST_ENTRY(half_precision_decode_basic),
- TEST_ENTRY(half_precision_to_float_transitive_test),
- TEST_ENTRY(double_as_smallest_encode_basic),
- TEST_ENTRY(half_precision_to_float_vs_rfc_test),
- TEST_ENTRY(bstrwraptest),
- TEST_ENTRY(bstr_wrap_error_test),
- TEST_ENTRY(bstr_wrap_nest_test),
- TEST_ENTRY(cose_sign1_tbs_test),
- //TEST_ENTRY(fail_test),
-};
-
-
-int run_tests(outputstring output, void *poutCtx, int *pNumTestsRun)
-{
- int nTestsFailed = 0;
- int nTestsRun = 0;
- UsefulBuf_MakeStackUB(StringStorage, 5);
-
- test_entry *t;
- const test_entry *s_tests_end = s_tests + sizeof(s_tests)/sizeof(test_entry);
-
- for(t = s_tests; t < s_tests_end; t++) {
- int x = (t->test_fun)();
- nTestsRun++;
- if(output) {
- (*output)(t->szTestName, poutCtx);
- }
-
- if(x) {
- if(output) {
- (*output)(" FAILED (returned ", poutCtx);
- (*output)(NumToString(x, StringStorage), poutCtx);
- (*output)(")\n", poutCtx);
- }
- nTestsFailed++;
- } else {
- if(output) {
- (*output)( " PASSED\n", poutCtx);
- }
- }
- }
-
- if(pNumTestsRun) {
- *pNumTestsRun = nTestsRun;
- }
-
- if(output) {
- (*output)( "SUMMARY: ", poutCtx);
- (*output)( NumToString(nTestsRun, StringStorage), poutCtx);
- (*output)( " tests run; ", poutCtx);
- (*output)( NumToString(nTestsFailed, StringStorage), poutCtx);
- (*output)( " tests failed\n", poutCtx);
- }
-
- return nTestsFailed;
-}
+int run_tests(outputstring output, void *poutCtx, int *pNumTestsRun);