Add mbedtls_x509_get_name memory leak unit test
Introduce a unit test to test mbedtls_x509_get_name() and add a testcase
with a corrupt DER-encoded name that causes mbedtls_x509_get_name() to
have to cleanup things it is allocated. If it fails to do this, a memory
leak is detected under Asan builds.
Signed-off-by: David Horstmann <david.horstmann@arm.com>
diff --git a/tests/suites/test_suite_x509parse.function b/tests/suites/test_suite_x509parse.function
index 60e703a..e8a2bb9 100644
--- a/tests/suites/test_suite_x509parse.function
+++ b/tests/suites/test_suite_x509parse.function
@@ -818,6 +818,42 @@
}
/* END_CASE */
+/* BEGIN_CASE depends_on:MBEDTLS_X509_CRT_PARSE_C */
+void mbedtls_x509_get_name( char * hex_name, int exp_ret )
+{
+ unsigned char *name;
+ unsigned char *p;
+ size_t name_len;
+ mbedtls_x509_name head;
+ mbedtls_x509_name *allocated, *prev;
+ int res;
+
+ name = mbedtls_test_unhexify_alloc( hex_name, &name_len );
+ p = name;
+
+ res = mbedtls_x509_get_name( &p, ( name + name_len ), &head );
+
+ if( res == 0 )
+ {
+ allocated = head.next;
+ head.next = NULL;
+ prev = NULL;
+
+ while( allocated != NULL )
+ {
+ prev = allocated;
+ allocated = allocated->next;
+
+ mbedtls_free( prev );
+ }
+ }
+
+ TEST_ASSERT( res == exp_ret );
+
+ mbedtls_free( name );
+}
+/* END_CASE */
+
/* BEGIN_CASE depends_on:MBEDTLS_X509_CREATE_C:MBEDTLS_X509_USE_C:MBEDTLS_X509_CRT_PARSE_C:!MBEDTLS_X509_REMOVE_INFO */
void mbedtls_x509_dn_get_next( char * name_str, int next_merged, char * expected_oids, int exp_count, char * exp_dn_gets )
{