tree 9d21e870bbfb9c6cb4bd0a3d276ddd796a789037
parent a9c6661d80af20d9c2aee4c390fa8d38249d67e3
author David Brown <david.brown@linaro.org> 1491920118 -0600
committer David Brown <david.brown@linaro.org> 1491920298 -0600

Back out unneeded part of random reset test

In change

    commit bb5635e07439c809d055d3413844c394c0b1b4bc
    Author: Fabio Utzig <utzig@utzig.org>
    Date:   Mon Apr 10 09:07:02 2017 -0300

        Add test of multiple random resets while upgrading

in addition to adding the try_random_fails, it shuffled the order that
the initial interruption test ran.  However, this test always clones
the flash device, so it doesn't matter what order the tests are run.
Revert this part of the change to avoid unnecessary complexity in the
code.